A new technique is being developed for exposure assessment, source monitoring, and model validation. The technique provides spatially and temporally resolved estimates of chemical concentrations in work place air. This technique combines the chemical measurement capability of open-path Fourier transform infrared (OP-FTIR) spectroscopy with the mapping capability of computed tomography (CT) to create two-dimensional contaminant concentration maps, non-invasively, and in near real-time.
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